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65 GHz Sampling Oscilloscope DCA1065
65 GHz Sampling Oscilloscope DCA1065
Up to 4 channels of 112
GBaud PAM4 signal testing 

for 1.6Tbps optical modules

65 GHz Sampling Oscilloscope DCA1065
1.6T Benchtop Bit Error Ratio Tester PBT3058
1.6T Benchtop Bit Error Ratio Tester PBT3058
Integrated water cooler MCB and 

extensible remote head options

1.6T Benchtop Bit Error Ratio Tester PBT3058
50G PON Burst Mode <br />Bit Error Ratio Tester rBT3250
50G PON Burst Mode
Bit Error Ratio Tester rBT3250
Applied to burst mode bit error

 testing of 25G/50G PON modules

50G PON Burst Mode <br />Bit Error Ratio Tester rBT3250
SiPh Wafer Test System sCT9002
SiPh Wafer Test System sCT9002
Edge Coupling/Vertical Coupling,

Compatible with 8-12 inch wafers

SiPh Wafer Test System sCT9002
Wafer Level Burn-In System<br>WLBI3810
Wafer Level Burn-In System
WLBI3810
Seamless parallel burn-in

test for 9 wafers

Wafer Level Burn-In System<br>WLBI3810
SiC KGD Die Handler<br>PB6800
SiC KGD Die Handler
PB6800
Modular design enables flexible loading, unloading, and multi -

site configuration.

SiC KGD Die Handler<br>PB6800
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