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MTP8104
High Speed Transceiver ATE
MTP8104
800G Optical Transceiver Tester
Nexustest MTP8104 is a comprehensive Bit Error Rate Analysis system which integrates multi-channel Bit Error Rate Tester, multi-port MCBs to host optical transceiver, and multi-channel independent temperature control units, making it ideal for mass-produced testing of high-speed 400G/800G optical transceiver across various ambient thermal cycle settings.
Highlights
  • Wide Rate Range & Exceptional Performance
    Rate support range: 24.33-58 Gbaud Independent Control: Each channel can be independently configured with NRZ/PAM4, amplitude and equalization
  • Comprehensive Capabilities
    Support PCS hardware layer’s FEC error correction analyzer
  • High-precision Testing
    Support ultra-fast and high-precision BER sampling (<10ms) Support MSA standard test
  • Rich test patterns
    PRBS7~31Q; SSPRQ /JP03A /JP03B /LIN /Square Wave/Custom Defined Patterns, etc
  • Excellent Signal Quality
    Rapid rise and fall time low intrinsic jitter
  • Humanized Design
    MCB connector mating cycles monitoring CMIS test with multiple hosts
  • Cost-effective
    Rich Accessories: Low maintenance costs like easy-replaceable MCBs Flexible Configuration: Convenient configuration & replacement of accessories, which significantly reduces the overall testing cost
  • Fully Match ATE Application Scenarios
    Support parallel API programmable processing by multiple hostsit Allow Flexible Ber test and temperature control between various channels
Functions and advantages
  • Multi-host parallel travel control, more flexible ATE multi-threaded task processing

    It supports mixed parallel testing of different types of modules, and supports testing OSFP/QSFP-DD/QSFP112/QSFP56 modules
  • Scientific design - double-sided TEC+ water cooler to achieve stronger temperature circulation efficiency

    Ramp time: ~2 min
    Temperature control range: -5°C~ +75°C
    Accurate temperature control: ±1°C
    Temperature test: DMI temperature of the module
    Power consumption of the module under test: 15W/module
    Number of modules under test: 4 QSFP-DD modules with parallel temperature control
  • Integrated optical port error analyzer (BERT), MCB, and TEC temperature cycle control unit

    It can be applied to the bit error performance and eye diagram quality test of 400G/800G optical modules in high and low temperature environments.
    Support QSFP-DD, OSFP, QSFP112 and other optical module packaging forms
  • Consumables maintenance – convenient and economical

    Motherboard/MCB split design - After the module has reached the end of its plug-in life, only need to remove the MCB separately and replace it.
    Plugging and unplugging of optical modules - the system counts in real time and reminds users to pay attention to the life of consumables in time;
    Consumables accessories such as TEC/press-knotted box/MCB are designed to be easily disassembled and assembled

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