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Laser Diode Test
CT6201-DC
CoC Test System
Nexustest CT6201 CoC Test System is efficient and convenient, and specifically designed for testing semiconductor laser chips, suitable for large-scale production testing of CoC.
The system uses the same test fixture as the Nexustest BI6201, simplifying the loading and unloading process of the chip and eliminating potential ESD risks during the loading and unloading process. The efficient and stable optical coupling design ensures the speed and reliability of optical coupling and spectral measurement. In addition, the system adopts a dual fixture platform design, with each platform having independent temperature control functions. While one platform is conducting product testing, the other platform can pre-control the temperature in advance, thereby reducing the waiting time for heating and cooling, and significantly improving testing efficiency in conjunction with the dual-side parallel testing of the CoC fixture.
Highlights
  • CoC and probe board
    Burn-in to the testing process CoC probe board does not separate
    Reduce the damage to CoC from the probe
  • Temperature control
    Supports 25℃ to 100℃
    Customizable low-temperature version, supports -10℃ to 100℃
  • High testing efficiency
    CoC testing time < 7.5s
  • Automatic loading and unloading fixture
    Holds up to 6 fishbone fixtures
  • High testing efficiency
    Threshold current repeatability: <±1%
    Power repeatability: <±1%
    Wavelength repeatability: <±0.15 nm
    SMSR repeatability: <5 dB
  • Self-developed SMU
    System defaults to integrating the self-developed precision SMU from Semight
  • Software functions
    All test results, statuses, and exception records are automatically saved to the database
    Supports efficient data storage and result traceability queries
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