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Laser Diode Burn-in
BI6201
CoC Burn-In System
The BI6201 Burn-in System is a high-density, multi-functional testing system specifically designed for the verification of the burn-in lifespan of semiconductor laser chips. The system adopts a modular framework and a large single-layer structure, significantly reducing system costs by integrating multi-channel power supplies, temperature controllers, real-time data acquisition capabilities, as well as standardized drawers and flexible fixture configurations. Customized test fixtures are suitable for various packaging types of semiconductor lasers, such as CoC (Chip on Carrier),etc. of different sizes. The fixtures can be easily replaced to adapt with different types of devices. The driving circuit of BI6201 features excellent protection networks to prevent any current or voltage overshoot, eliminating potential EOS risks. It also allows setting thresholds for current and voltage, and the system can shut down abnormal channels when the output values exceed the threshold, providing enhanced protection for the tested chips. In addition to integrating protection functions into the control circuit, the system design also considers channel-to-channel isolation performance and electrostatic discharge (ESD) protection.
Highlights
  • Driving power supply
    Supports up to 4224 channels of 4-quadrant SMU driving power
  • Strong thermal conductivity
    Temperature deviation ＜ ±1℃ for the overall thermal sink（40～100℃）
  • Temperature control
    Each fixture has independent heating, temperature control, monitoring, over temperature protection and heat dissipation units for energy saving.
  • Fixture
    Fishbone-type fixture which support wire bonding on it
  • Safety and reliability
    Comprehensive protection mechanisms through hardware and software eliminate potential issues such as EOS
  • Online power monitoring
    Optional configuration for online power monitoring, supporting complete LIV or EA scans, with the ability to analyze Ith.
    The test repeatability deviation ＜±1%
  • 4224 CoC simultaneously burn-in
    Production capacity flexibly configured based on customer requirements
  • Software functions
    All test results, test statuses, and abnormal conditions are recorded in the database which could be stored and traced efficiently
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