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Laser Diode Burn-in
BI6201
CoC Burn-In System
The BI6201 burn in system is a high-density, multi-functional testing system specifically designed for the verification of the aging lifespan of semiconductor laser chips. The system adopts a modular framework and a large single-layer structure, significantly reducing system costs by integrating multi-channel power supplies, temperature controllers, real-time data acquisition capabilities, as well as standardized drawers and flexible fixture configurations. Customized test fixtures are suitable for various packaging types of semiconductor lasers, such as CoC (Chip on Carrier), TO-Can, etc., of different sizes. The fixtures can be easily replaced to accommodate different device types. The driving circuit of BI6201 features excellent protection networks to prevent any current or voltage overshoot, eliminating potential EOS risks. It also allows setting thresholds for current and voltage, and the system can shut down abnormal channels when the output values exceed the threshold, providing enhanced protection for the tested chips. In addition to integrating protection functions into the control circuit, the system design also considers channel-to-channel isolation performance and electrostatic discharge (ESD) protection.
Highlights
  • SMU drive power supply
    Support up to 4224 channels of 4-quadrant SMU drive power supply
  • Support LIV / EA sweep
    Online power monitoring, supporting complete liv/EA sweep
  • Analytical ability
    With ith and DCER analysis ability, test repeatability deviation < 1%
  • Large capacity
    4224 four-quadrant electrical channel design make the system very flexible;
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