Menu

Find what you're looking for
Home · Products · Electronic Measurement · Wafer Acceptance Test ·
Wafer Acceptance Test
WAT6600
Parallel Parametric Test System
WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on.
Highlights
  • Self-developed
    Self-developed hardware and measurement resources
    stable supply chain, short lead time
  • High output capability
    Perpin resource providing
    SMU: 200 V max, 1 A max, PGU: ±20 V
  • Configurable Pin number
    Maximum 48 Pin full kelvin
  • High precision
    The accuracy down to 1 pA
    system leakage current ＜500 fA
    Extremely low current measurement
  • SECS/GEM compliance
    Easy integration to customer EAP or factory automation
  • Built-in Maintenance Software CAL/DIAG/PV
    Fast troubleshooting and diagnostic of hardware problem, timely guarantee of tester performance
  • Compatible with 48 pin
    48 pin 230 mm-diamter probe card
    Protect customer investment on probe card, low migration cost to new tester
  • Compatible with mainstream probers
    TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.
Related solutions
Artificial Intelligence
Artificial Intelligence
Nexustest Instruments provides one-stop test solutions such as laser optical modules
Data Communications
Data Communications
OLT is the core device of optical access network, and its unique burst acceptance mode puts forward extremely high requirements for testing
Semiconductor
Semiconductor
Semiconductors are the core of electronic products and the cornerstone of the information industry
Scientific Research
Scientific Research
Nexustest Instruments provides one-stop test solutions such as laser optical modules
Emerging Fields
Emerging Fields
Nexustest Instruments provides one-stop test solutions such as laser optical modules
Products
High Speed Communication Test Electronic Measurement Optical Chip Test Power Semiconductor Test
Solutions
Artificial Intelligence Data Communications Semiconductor Scientific Research Emerging Fields
Support
Services FAQ
News
Marketing Activities
About Us
Company Profile Join Us

Copyright © Nexustest All Rights Reserved

Privacy PolicyLegal NoticesUser Agreement

LOG IN Create account
Don't remember your password?

Register an account

LOG IN Create account

User name*

email*

Email verification code

password

Confirm Password

Retrieve password

Email*

Email verification code*

New Password*

Confirm Password*