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Wafer Acceptance Test
WAT6600
Parallel Parametric Test System
WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on.
Highlights
  • Self-developed
    Self-developed hardware and measurement resources
    Stable supply chain, short lead time
  • High output capability
    Perpin resource providing
    SMU:200V max 1A max, PGU:±20V
  • Configurable Pin number
    Maximum 48 Pin full kelvin
  • High precision
    The accuracy down to 1pA, system leakage current ＜500fA, Extremely low current measurement
  • SECS/GEM compliance
    Easy integration to customer EAP or factory automation
  • Built-in Maintenance software
    CAL/DIAG/PV Fast troubleshooting and diagnostic of hardware problem, timely guarantee of tester performance
  • Compatible with 48pin
    48pin 230mm-diamter probe card Protect customer investment on probe card, low migration cost to new tester
  • Compatible with mainstream probers
    TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.
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