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Silicon Photonics
sCT9001
SiPh Wafer Test System
Nexustest Instruments sCT9001 fully automatic silicon photonics wafer test system is provided with high test accuracy, good test stability and flexible expandability, which is suitable for laboratory verification and mass production testing.
Highlights
  • Automatic/Semi-automatic
    Support automatic and semi-automatic wafer loading and unloading
  • Wafer size
    Supports 8-inch and 6-inch wafers(4- and 12-inch can be customized)
  • Test temperature
    Support the test temperature range from room temperature to 150 ℃ (other temperatures can be customized)
  • Test function
    Support optical-optical test, photoelectric test and electrical parameter test
  • DC/AC
    Support DC and AC test
  • Grating vertical coupling
    Grating coupling, FA coupling, and edge coupling
  • High efficiency
    For different types of chips, support rapid replacement of different types of pin cards
  • Software function
    The software supports the addition of customer database and MES functions
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