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High Speed Transceiver ATE
MTP4104
400G Transceiver Tester
MTP4104 is a comprehensive bit error test system with an integrated optical port bit error ratio tester (BERT) and Temperature control unit. Without RF cable connection required, the bit error test of high-speed optical modules in different temperature environments can be realized through ambient temperature settings, such as 400G QSFP_DD PAM4 transeivers, and more optical modules below 100G, such as SFP28 (four ways in parallel), QSFP28 (two ways in parallel), etc.; The integrated MCB test card enables flexible and fast DUT plug-in test without additional high-speed RF cables; The integrated standard light source socket further reduces the space and cost of the test rig without additional bit error tester equipment and MCB; The transceivers of different packaging types can be tested by replacing the MCB test card and the supporting test fixture, mainly including 400G/200G QSFP_DD, 100G QSFP28, SFP+28G, etc.
Highlights
  • Independent configuration
    Each channel can be independently configured as NRZ or PAM4 signal system;
  • Multi-rate
    Rate support range: 20-30 Gbaud
  • FEC
    Support FEC simulation test analysis;
  • Rich code types
    SSPRQ/JP03A/JP03B/LIN/square wave/user-defined patterns, etc.;
  • Frequency dividing output
    Trigger signal supports frequency division output (4-128 frequency division);
  • High performance
    Fast rising and falling edge, low inherent jitter;
  • High power
    Support high power mode transmitter output;
  • Powerful data analysis
    Flexible database management functions to assist R&D in in-depth data analysis
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