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Wafer Level Reliability
WLR0100
Wafer Level Reliability Test System
WLR0100 is a standard high-temperature reliability test system for semiconductor wafer level devices provided by Nexustest Instruments. It provides high-precision, high-voltage output which can store and record high-precision current for a long time, and tests related functions of devices.
Highlights
  • Voltage range
    0-200V software settable
  • Channel hardware independent current limiting
    0-10mA software settable
  • Monitoring current sampling rate
    Minimum 10nA accuracy The polling of 32 products on a single board is completed in 1 second
  • Independent double temperature zone
    Up to 200 ℃
  • Single board support channel
    32 channels
  • Channel independent gear
    It can meet the accuracy and range requirements, and the channel is independent
  • Product abnormal protection function
    The equipment has overvoltage and overcurrent protection functions
  • Support nitrogen access protection
Functions and advantages

  • Burn-in Board for DIP Package

    The supporting burn-in board adopts a gold finger structure. The following figure shows a typical DIP packaged of burn-in Board.

  • The WLR0100 test software platform is a configurable platform, including the following functions:

    Support the in place pre inspection function of online products, which can detect whether the user has good plug and pull contact;
    Support flexible editing and configuration of aging reliability tasks, and conduct reliability testing;
    Provide intuitive data display and data analysis functions;
    Support user authority control, including engineer, technician and operator.
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