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Wafer Acceptance Test
WAT6300
High Voltage Parametric Test System
WAT6300 is a serial high-voltage semiconductor parametric test system. The system is configurable to realize vertical and universal high-voltage tests, and it can quickly perform accurate high and low voltage DC measurements, capacitance measurements, etc.
Highlights
  • Self-developed hardware resources
    Self-developed SMU & HV-SMU, PGU, Low-leakage Switch Matrix, HV Switch Matrix Stable supply chain, short lead time
  • 3500V high voltage
    Meet very high voltage test for SiC, GaN
  • Flexible configuration of Pin number
    Support 48 pin full kelvin pins
  • High precision
    System leakage current ＜ 1pA Extremely low current measurement
  • SECS/GEM compliance
    Easy integration to customer EAP or factory automation
  • Built-in Maintenance software
    CAL/DIAG/PV Fast troubleshooting and diagnostic of hardware problem
  • 48pin 230mm-diamter probe card
    Protect customer investment on probe card, low migration cost to new tester
  • Compatible with mainstream probers
    TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.
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