Different from consumer grade products, automobiles will operate in harsh environments such as outdoor, high temperature, cold and humid, and the design life is generally 15 years or 200000 kilometers. The iteration cycle will be much higher than that of consumer electronics for 2-3 years, and the requirements on environment, vibration, impact, reliability and consistency are also high. Therefore, automobile enterprises usually require suppliers to use vehicle grade components to ensure the quality and reliability of on-board ECU products.
With the mission of continuously filling the gap of domestic high-end optoelectronic testing equipment, Nexustest has developed semiconductor chip testing machine (silicon carbide KGD testing machine PB6200&PT6200), wafer level reliability (silicon carbide high-voltage wafer aging WLR3500) and other equipment in combination with its core advantages, such as weak signal detection, high-power signal detection and complex probe system design, Help the high-speed and high-quality development of domestic power devices.
